prof. Ing. Ondřej Novák, CSc.

prof. Ing. Ondřej Novák, CSc. QR VCARD
LinePositionDepartmentOffice number
+420 48535 3460Head of DepartmentInstitute of Information Technology and ElectronicsA02032


  1. O. Novák, M. Rozkovec, J. Plíva, Decompressors Using Nonlinear Codes, Microprocessors and Microsystems, Elsevier, 1, 10 pages, ISSN: 0141-9331, [Online], 2020
  2. M. Rozkovec, O. Novák, J. Plíva, Combinational Decompressors with Nonlinear Codes, Proceedings - Euromicro Conference on Digital System Design, DSD 2019, IEEE, 1, ISBN: 978-172812861-0, p. 500-505, 6 pages, [Online], 2019
  3. O. Novák, Nonlinear Compression Codes Used In IC Testing, Proceedings - 2019 22nd International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2019, NEW YORK, USA, IEEE, 1, ISBN: 978-1-72810-073-9, 4 pages, [Online], 2019
  4. O. Novák, Nonlinear binary codes and their utilization for test, 2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), IEEE, 1, ISBN: 9781538657546, p. 15-20, 6 pages, ISSN: 2473-2117, [Online], 2018
  5. O. Novák, Test Compression Using Extended Nonlinear Binary Codes, 2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS), IEEE, 1, ISBN: 978-153865992-2, p. 255-256, 2 pages, [Online], 2018
  6. O. Novák, Z. Plíva, Test response compaction method with improved detection and diagnostic abilities, Microelectronics Reliability, Elsevier BV, 1, p. 249-256, 8 pages, ISSN: 0026-2714, [Online], 2018
  7. O. Novák, Extended binary nonlinear codes and their application in testing and compression, 2017 22ND IEEE EUROPEAN TEST SYMPOSIUM (ETS), Limassol, IEEE, 1, ISBN: 978-1-5090-5457-2, p. 1-2, 2 pages, ISSN: 15301877, [Online], 2017
  8. O. Novák, Z. Plíva, Logic Testing with Test-per-Clock Pattern Loading and Improved Diagnostic Abilities, Proceedings - 2017 IEEE 20th International Symposium on Design and Diagnostics of Electronic Circuit and Systems, DDECS 2017, 1, ISBN: 978-153860471-7, p. 54-59, 6 pages, ISSN: 2334-3133, [Online], 2017
  9. O. Novák, M. Rozkovec, J. Jeníček, Sequential Test Decompressors with Fast Tester Bits Wide-Spreading, JOURNAL OF CIRCUITS SYSTEMS AND COMPUTERS, SINGAPORE, WORLD SCIENTIFIC PUBL CO PTE LTD, 5 TOH TUCK LINK, SINGAPORE 596224, 16 pages, ISSN: 0218-1266, n. 8, [Online], 2017
  10. Z. Plíva, P. Pfeifer, M. Rozkovec, O. Novák, Dependable Systems on FPGAs, 2016
  11. P. Cvek, O. Novák, Linux task scheduler for reconfigurable hardware accelerators, Proceedings of the Biennial Baltic Electronics Conference, BEC, Tallinn, IEEE Computer Society, ISBN: 978-1-5090-1393-7, p. 71-74, 4 pages, ISSN: 1736-3705, 2016
  12. O. Novák, J. Jeníček, M. Rozkovec, Sequential test decompressors with fast variable wide spreading, Formal Proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2016, Košice, Slovakia, IEEE, ISBN: 978-1-5090-2816-0, p. 132-137, 6 pages, [Online], 2016
  13. O. Novák, J. Jeníček, M. Rozkovec, Test Decompressor Effectivity Improvement, Proceedings - 19th Euromicro Conference on Digital System Design, DSD 2016, Limassol, Cyprus, IEEE, ISBN: 978-1-5090-2816-0, p. 661-664, 4 pages, [Online], 2016
  14. P. Cvek, O. Novák, Generic GNU/Linux reconfiguration platform proposal, 2015 IEEE INTERNATIONAL WORKSHOP OF ELECTRONICS, CONTROL, MEASUREMENT, SIGNALS AND THEIR APPLICATION TO MECHATRONICS (ECMSM), Liberec, CZECH REPUBLIC, IEEE, 345 E 47TH ST, NEW YORK, NY 10017 USA, 1, ISBN: 978-1-4799-6972-2, p. 1-6, 6 pages, [Online], 2015
  15. O. Novák, J. Jeníček, M. Rozkovec, LFSR Reseeding Based Test Compression Respecting Different Controllability of Decompressor Outputs, 18th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2015, Belgrade, Serbia, Institute of Electrical and Electronics Engineers Inc., 1, ISBN: 978-1-4799-6780-3, p. 9-14, 6 pages, [Online], 2015
  16. O. Novák, J. Jeníček, M. Rozkovec, Test compression for circuits with multiple scan chains, 2015 16th Latin-American Test Symposium, LATS 2015, Puerto Vallarta; Mexico, Institute of Electrical and Electronics Engineers, 1, ISBN: 978-1-4673-6710-3, p. neuvedeno, 6 pages, [Online], 2015